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Facilities

Edinburgh Instruments FLS1000 Luminescence Spectrometer

The Edinburgh FLS1000 system is a modular fluorescence spectrometer for measuring spectra from the ultraviolet to the near-infrared spectral range (250 to 2550 nm), and lifetimes spanning from picoseconds to seconds. The system currently houses three light sources (450 W ozone-free Xenon arc lamp, microsecond Xenon flashlamp, 405nm picosecond pulsed diode laser), three detectors (Si PMT, InGaAs PMT, and InGaAs steady-state detector), an integrating sphere attachment for measuring absolute photoluminescence quantum yields, and a fiber optics module for external measurements. The large sample compartment is equipped to measure either solution phase samples in a cuvette or solid-state samples on specially designed film or crystal holders. Light sources, detectors, grating, slits, and polarizers are all computer-controlled for accurate and precise measurements. Additionally, all spectral data are corrected in real time for the spectral response of both the light source and detector, making data measured on this system immediately ready for publication.

Capabilities

  • Wide-range spectral measurements from 230 -2550 nm for emission measurements with a range of 230-900 nm for excitation measurements
  • High performance Fluoracle® software package enables automatic spectral correction, lifetime fitting, and experiment automation
  • Double-monochromator resolution and stray light rejection
  • Automatic excitation and emission polarization optics enabling optical anisotropy measurements
  • Multiple excitation sources (450W Xe lamp; Xe flash lamp; 405 nm picosecond pulsed diode laser)
  • Time-resolved photoluminescence capabilities using either multichannel scaling (MCS) or time-correlated single photon counting (TCSPC) electronics enabling lifetime measurements from <1 ns to 50 seconds
  • PMT detectors for wavelength range from 230- 1700 nm for lifetime measurements
  • Modular sample chamber enabling measurement of wide range of samples
  • Integrating sphere accessory for absolute quantum yield measurements
Location

NanoES G65B

Primary Contact

Click here to view the facility contacts.

Specifications and Research Highlights

Click here to view the manufacturer specifications. Click here to view an instrument highlight.

Glovebox-Integrated Bruker Edge Atomic Force Microscopy (AFM)

The Bruker Dimension Edge AFM measures nanometer-scale microscopy by rastering (over a surface of interest) a sharp probe, the z-position of which is controlled in a closed-loop feedback on a measure of the atomic forces on the probe by the surface. These forces are strongly dependent on the probe-surface distance, and so the z-adjustments required to maintain constant force during rastering are directly related to the topographical and morphological features. This AFM is inside of the 2D materials manipulation glovebox, allowing study of air- and water-sensitive samples prepared inside the glovebox with direct access to additional in-glovebox capabilities, e.g. optical microscopy, and 2D stacking. The Edge has an ergonomic design with facile set-up (sample loading, cantilever mounting and calibration) and scan control.

Capabilities

  • Glovebox integration enables measurement of air and water sensitive samples
  • Dry isolation stage minimizes vibrational noise from glovebox environment
  • Motorized x-y stage with vacuum sample chuck allows easy mounting and access to wafer-scale samples
  • AFM modes available: contact mode, non-contact “tapping” mode, proprietary Peak-Force mode
  • Standard AFM tips available on-site, specialty tips can be purchased by request
  • Piezoelectric Force Microscopy available
Location

NanoES G65B

Primary Contact

Click here to view the facility contacts.

Specifications

Click here to view the manufacturer specifications.

Bruker Icon Atomic Force Microscope (AFM)

The Bruker Dimension Icon AFM measures nanometer-scale microscopy by rastering (over a surface of interest) a sharp probe, the z-position of which is controlled in a closed-loop feedback on a measure of the atomic forces on the probe by the surface. These forces are strongly dependent on the probe-surface distance, and so the z-adjustments required to maintain constant force during rastering are directly related to the topographical and morphological features. The Icon AFM incorporates the latest evolution of Bruker’s nanoscale imaging and characterization technologies on a large sample tip-scanning AFM platform. The Icon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y.

Capabilities

  • Significantly reduced noise floor at less than 30 pm enabling imaging at sub-nanometer resolution
  • Drift rates less than 200pm per minute render distortion-free images immediately
  • Integrated alignment tools deliver quick and optimized probe positioning
  • High-resolution camera and X-Y positioning permit faster, more efficient sample navigation
  • Wide-open access to tip and sample accommodates a large variety of standard and customized experiments
  • AFM modes available: contact mode, non-contact “tapping” mode, proprietary Peak-Force mode
  • Standard AFM tips available on-site, specialty tips can be purchased by request
  • Piezoelectric Force Microscopy available
Location

NanoES G65B

Primary Contact

Click here to view the facility contacts.

Specifications and Research Highlights

Click here to view the manufacturer specifications. Click here to view an instrument highlight.