The Park systems AFM is a scanning probe tool that can image surfaces down to the nanometer scale. It uses a sharp probe whose z-position over the surface of interest is controlled in a closed-loop feedback measuring the atomic forces of the surface on the probe. These forces are strongly dependent on the probe-surface distance and so the z-adjustments required to maintain constant force during scanning are directly related to the topographical and morphological features. This AFM is a versatile tool to probe and clean various devices, with an additional control on the temperature.
Capabilities
- AFM scanning modes available : non contact mode, tapping mode, contact mode
- An integrated Lock-in allows to perform electric force microscopy such as Piezoelectric Force Microcopy and Kelvin Probe Force Microscopy.
- Motorized x-y scanning stage with magnetic mounting of samples that allows to mount a wide range of samples.
- Standard AFM tips available on-site, specialty tips can be purchased by request
- Optional heating stage is available to probe samples at a wide range of temperatures (room temperature to 300C).
Location
NanoES G65B
Primary Contact
Click here to view the facility contacts.
Specifications
Click here to view the manufacturer specifications.
