Note: The Park NX10 was recently added to the MSF and is still undergoing commissioning. Check back soon for information about accessing and using the new AFM.
Introducing our latest addition to the UW MEMC’s toolkit – the Park NX10 Atomic Force Microscope (AFM)! We’re thrilled to announce the arrival of the Park NX10, an AFM system with advanced imaging and measurement capabilities at the nanoscale level. The Park NX10 will enable MSF users to delve deeper into the structure and properties of materials. Key features of the Park NX10 include High-resolution imaging/ Precise measurement of surface topography and material properties/ Advanced scanning modes.
The Bruker Dimension Edge AFM measures nanometer-scale microscopy by rastering (over a surface of interest) a sharp probe, the z-position of which is controlled in a closed-loop feedback on a measure of the atomic forces on the probe by the surface. These forces are strongly dependent on the probe-surface distance, and so the z-adjustments required to maintain constant force during rastering are directly related to the topographical and morphological features. This AFM is inside of the 2D materials manipulation glovebox, allowing study of air- and water-sensitive samples prepared inside the glovebox with direct access to additional in-glovebox capabilities, e.g. optical microscopy, and 2D stacking. The Edge has an ergonomic design with facile set-up (sample loading, cantilever mounting and calibration) and scan control.
Capabilities
- Glovebox integration enables measurement of air and water sensitive samples
- Dry isolation stage minimizes vibrational noise from glovebox environment
- Motorized x-y stage with vacuum sample chuck allows easy mounting and access to wafer-scale samples
- AFM modes available: contact mode, non-contact “tapping” mode, proprietary Peak-Force mode
- Standard AFM tips available on-site, specialty tips can be purchased by request
- Piezoelectric Force Microscopy available
Location
NanoES G65B
Primary Contact
Click here to view the facility contacts.
Specifications
Click here to view the manufacturer specifications.
The Bruker Dimension Icon AFM measures nanometer-scale microscopy by rastering (over a surface of interest) a sharp probe, the z-position of which is controlled in a closed-loop feedback on a measure of the atomic forces on the probe by the surface. These forces are strongly dependent on the probe-surface distance, and so the z-adjustments required to maintain constant force during rastering are directly related to the topographical and morphological features. The Icon AFM incorporates the latest evolution of Bruker’s nanoscale imaging and characterization technologies on a large sample tip-scanning AFM platform. The Icon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y.
Capabilities
- Significantly reduced noise floor at less than 30 pm enabling imaging at sub-nanometer resolution
- Drift rates less than 200pm per minute render distortion-free images immediately
- Integrated alignment tools deliver quick and optimized probe positioning
- High-resolution camera and X-Y positioning permit faster, more efficient sample navigation
- Wide-open access to tip and sample accommodates a large variety of standard and customized experiments
- AFM modes available: contact mode, non-contact “tapping” mode, proprietary Peak-Force mode
- Standard AFM tips available on-site, specialty tips can be purchased by request
- Piezoelectric Force Microscopy available
Location
NanoES G65B
Primary Contact
Click here to view the facility contacts.
Specifications and Research Highlights
Click here to view the manufacturer specifications. Click here to view an instrument highlight.
