The Xeuss 3.0 is the latest generation instrument for Small Angle X-ray Scattering and is already installed in leading research facilities around the world. It incorporates all the latest innovations from Xenocs for added capabilities, flexibility and ease-of-use.
Capabilities
- Particle size distribution ranging from a few nanometers to more than 300 nm in diameter (or up to few microns with USAXS)
- Crystallization rates and lamellar structure of semicrystalline polymers
- Size and shape analysis of surfactants or proteins and other macromolecules in solutions
- Organization and orientation of nanomaterials at the atomic- or the nano-scale, in bulk or at surfaces
- Phase segregation studies of alloys
- Operando and in situ studies
Sample Holders (Stages)
- Solid stage: for measuring solid films;
- Powder and gel stages;
- Capillary stage: for measuring liquid solutions or dispersions;
- GISAXS stage: for Grazing-Incidence Small Angle X-ray Scattering measurements;
- Peltier stage: for measuring samples at temperatures from -30 C to 150 C;
- Humidity stage: for measuring samples at relative humidity from 1 % to 95 %;
- Modular force stage: for measuring solid samples under mechanical stress;
- Temperature stage: for measuring samples at temperatures from -150 C to 350 C;
- Biocube: robot to automatically load samples into capillaries.
Location
NanoES G93
Primary Contact
Click here to view the facility contacts.
Specifications and Research Highlights
Click here to view the manufacturer specifications.
The Edinburgh FLS1000 system is a modular fluorescence spectrometer for measuring spectra from the ultraviolet to the near-infrared spectral range (250 to 2550 nm), and lifetimes spanning from picoseconds to seconds. The system currently houses three light sources (450 W ozone-free Xenon arc lamp, microsecond Xenon flashlamp, 405nm picosecond pulsed diode laser), three detectors (Si PMT, InGaAs PMT, and InGaAs steady-state detector), an integrating sphere attachment for measuring absolute photoluminescence quantum yields, and a fiber optics module for external measurements. The large sample compartment is equipped to measure either solution phase samples in a cuvette or solid-state samples on specially designed film or crystal holders. Light sources, detectors, grating, slits, and polarizers are all computer-controlled for accurate and precise measurements. Additionally, all spectral data are corrected in real time for the spectral response of both the light source and detector, making data measured on this system immediately ready for publication.
Capabilities
- Wide-range spectral measurements from 230 -2550 nm for emission measurements with a range of 230-900 nm for excitation measurements
- High performance Fluoracle® software package enables automatic spectral correction, lifetime fitting, and experiment automation
- Double-monochromator resolution and stray light rejection
- Automatic excitation and emission polarization optics enabling optical anisotropy measurements
- Multiple excitation sources (450W Xe lamp; Xe flash lamp; 405 nm picosecond pulsed diode laser)
- Time-resolved photoluminescence capabilities using either multichannel scaling (MCS) or time-correlated single photon counting (TCSPC) electronics enabling lifetime measurements from <1 ns to 50 seconds
- PMT detectors for wavelength range from 230- 1700 nm for lifetime measurements
- Modular sample chamber enabling measurement of wide range of samples
- Integrating sphere accessory for absolute quantum yield measurements
Location
NanoES G65B
Primary Contact
Click here to view the facility contacts.
Specifications and Research Highlights
Click here to view the manufacturer specifications. Click here to view an instrument highlight.
