A Nikon Eclipse TE2000-U inverted microscope with excitation and detection hardware and electronics to perform single-particle spectroscopy and blinking measurements. In addition, this microscope has been integrated via fiber coupling and electronics with the MSF’s existing Edinburgh FLS1000 fluorometer. This integrated configuration allows users to obtain spatially resolved spectroscopic information about luminescent samples. The combination of a Xenon white light source and multiple lasers in the excitation path enables users to carry out wide-field and confocal microscopy experiments.
Location
NanoES G65B
Primary Contact
Click here to view the facility contacts.
This custom XES instrument consists of two independent, integrated spectrometers simultaneously measuring phosphorus Kα and Kβ XES. While the Kα XES gives information on oxidation state distribution, the Kβ XES gives additional information about electronic structure, including sensitivities such as ligand identity, symmetry, and bonding information. This dual capability system allows measurement of both of these channels for maximum information content of each sample.
Capabilities
- Glovebox integration enables measurement of air and water sensitive samples
- Simultaneous measurement of phosphorus Kα and Kβ emission regions
- Automated sample chamber for measurement of up to 15 samples with minimal effort
Location
NanoES G65B
Primary Contact
Click here to view the facility contacts.
Specifications and Research Highlights
Click here to view the manufacturer specifications. Click here to view an instrument highlight.
The Edinburgh FLS1000 system is a modular fluorescence spectrometer for measuring spectra from the ultraviolet to the near-infrared spectral range (250 to 2550 nm), and lifetimes spanning from picoseconds to seconds. The system currently houses three light sources (450 W ozone-free Xenon arc lamp, microsecond Xenon flashlamp, 405nm picosecond pulsed diode laser), three detectors (Si PMT, InGaAs PMT, and InGaAs steady-state detector), an integrating sphere attachment for measuring absolute photoluminescence quantum yields, and a fiber optics module for external measurements. The large sample compartment is equipped to measure either solution phase samples in a cuvette or solid-state samples on specially designed film or crystal holders. Light sources, detectors, grating, slits, and polarizers are all computer-controlled for accurate and precise measurements. Additionally, all spectral data are corrected in real time for the spectral response of both the light source and detector, making data measured on this system immediately ready for publication.
Capabilities
- Wide-range spectral measurements from 230 -2550 nm for emission measurements with a range of 230-900 nm for excitation measurements
- High performance Fluoracle® software package enables automatic spectral correction, lifetime fitting, and experiment automation
- Double-monochromator resolution and stray light rejection
- Automatic excitation and emission polarization optics enabling optical anisotropy measurements
- Multiple excitation sources (450W Xe lamp; Xe flash lamp; 405 nm picosecond pulsed diode laser)
- Time-resolved photoluminescence capabilities using either multichannel scaling (MCS) or time-correlated single photon counting (TCSPC) electronics enabling lifetime measurements from <1 ns to 50 seconds
- PMT detectors for wavelength range from 230- 1700 nm for lifetime measurements
- Modular sample chamber enabling measurement of wide range of samples
- Integrating sphere accessory for absolute quantum yield measurements
Location
NanoES G65B
Primary Contact
Click here to view the facility contacts.
Specifications and Research Highlights
Click here to view the manufacturer specifications. Click here to view an instrument highlight.
